article · Mathematics
The quality performance of many vital systems depends on how long the units are performing; hence, research works started focusing on increasing the reliability of systems while taking into consideration that many factors may cause the failures of operating systems. In this study, the combination of a parametric generalized linear failure rate distribution model and an adaptive progressive Type-II censoring scheme for practical purposes is explored. A comprehensive investigation is performed on the risk factors that cause failure and determines which of the factors has a more harmful effect on the units. A lifetime experiment is performed under the condition of an adaptive progressive Type-II censoring scheme to obtain observations as a result of the competing factors of failures. The obtained observations are assumed to follow a three-parameter generalized linear failure rate distribution and are assumed to be competing to cause failure. Two statistical inference methods are employed for estimating this model’s parameters: the frequentist maximum likelihood method and the Bayesian approach. Our model’s validity is demonstrated through extensive simulations and real data applications in the medical and electrical engineering fields.
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DOI: 10.3390/math12111763
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