article · IEEE Access
This paper introduces a new reliability class, the exponential better than used after age <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">t<sub/>0 </i> in increasing convex Laplace transform order <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">(EBUCL∗t<sub>0</sub>)</i>, and develops a corresponding statistical test for exponentiality. The test is constructed within the U-statistics framework and its theoretical properties, including asymptotic distribution and Pitman’s asymptotic efficiency, are established. Extensive Monte Carlo simulations are conducted to evaluate critical values and power performance under both complete and censored samples. Results demonstrate that the proposed procedure achieves higher efficiency and superior power compared to existing nonparametric tests. Applications to diverse engineering datasets (electrical insulation, glass fiber strength, polyester fibers, LED lifetimes, and windshields failure) and biomedical data (melanoma patients) confirm its practical utility in detecting deviations from exponentiality and modeling aging phenomena. Overall, the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EBUCL∗t<sub>0</sub></i> test provides a robust and versatile tool for reliability engineering and survival analysis, particularly in scenarios involving aging effects and censored data.
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DOI: 10.1109/access.2026.3694825
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