What makes nanomaterials particularly promising for several applications, including electronics, is their remarkable surface-to-volume ratio. Indeed, their nanometric size brings new properties that only occur on this scale. Their characterization is therefore crucial for the design and prediction of potential new activities. Various advanced techniques can be used for this investigation, each providing valuable information about their shape, size, surface charge, structure, agglomerations state, etc., including scanning electron microscopy (SEM), atomic force microscopy (AFM), zeta potentiometer, X-ray diffraction (XRD), and Fourier transform infrared spectroscopy (FTIR). These latest nanomaterial characterization techniques will be described in detail in this chapter. The holistic description will allow for a detailed understanding of the arsenal of tools available, which is essential to advance our understanding of their properties and possible applications, whether for research, industry, regulation, standardization, or nanometrology.
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DOI: 10.1002/9783527817474.ch3
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