article · Journal of the Nigerian Society of Physical Sciences
Fractional uncertain differential equations have been used to model random processes in economics and other fields that exhibit jumps, dependency, and nonlinearities, and which possess uncertainties due to limited data and inadequate models. In this paper, a double V-jump fractional uncertain differential equation (DV-FUDE) is presented as a $\theta^{th}$-order Riemann-Liouville or Caputo fractional uncertain differential equation with the addition of two V-jump independent processes on different filtrations. The equation models systems possessing two sources of uncertain shocks attributed to internal and external factors, respectively. Exact solutions in the case of time-dependent coefficients are given in terms of the Mittag-Leffler function. Sample continuity, existence, and uniqueness for the general Riemann-Liouville and Caputo DV-FUDE are established using the Banach Fixed Point Theorem, under global Lipschitz and linear growth conditions on the coefficients. Some extensions and possible areas of application are highlighted for future research.
This page summarises published work. The authoritative version sits with the publisher.
DOI: 10.46481/jnsps.2026.3153
Is something wrong with this record? Report it or request removal.
Discussion
Have you built on this work, tried to replicate it, or seen it applied in practice? Share what you know. Verified researchers and MARATTO™ domain experts can open a discussion, and any member can reply. Contributions are reviewed before they appear.
No discussion yet. Open the first thread.
New to MARATTO™? Create a free account.