article
Research on exons and introns is important to the structure knowledge, regulation, and genes’ evolution. The multifractal analysis allows the genetic structure to be studied on varying scales. This paper presents a novel approach to characterize and classify C.elegans exons and introns sequence based on multifractal features and the Support Vector Machine (SVM) classifier. First, we transform the genomic sequence into an FCGR image, and then the multifractality spectrum is calculated by applying the box-counting method. Finally, we use the SVM classifier by testing different kernels. Our classification method has shown promising results for the learning and testing rates exceeding 75%
This page summarises published work. The authoritative version sits with the publisher.
DOI: 10.1109/atsip62566.2024.10638897
Is something wrong with this record? Report it or request removal.
Discussion
Have you built on this work, tried to replicate it, or seen it applied in practice? Share what you know. Verified researchers and MARATTO™ domain experts can open a discussion, and any member can reply. Contributions are reviewed before they appear.
No discussion yet. Open the first thread.
New to MARATTO™? Create a free account.