article · Optical and Quantum Electronics

Atomic force microscopy and ellipsometry investigations of rare earth oxide Dy2O3 nano-layer processed by electron beam evaporation on n-GaAs substrate

W. Ouerghui
H. Saghrouni
Lotfi Béji

202315 citationsUniversity of Tunis El Manar

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Research topics

Semiconductor materials and devices
Diamond and Carbon-based Materials Research
Force Microscopy Techniques and Applications

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DOI: 10.1007/s11082-023-05866-7

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